| ¹øÈ£ | Á¦¸ñ | ´ã´çºÎ¼ | ÀÛ¼ºÀÏ | Á¶È¸¼ö | »óÅ | ||
| 332 |
KAIST ±×¸°Ä·ÆÛ½º ¸¶½ºÅÍÇ÷£ ¼ö¸³¿ë¿ª
|
°ü¸®ÀÚ | 2013-05-16 | 34 | ÀÔÂû¿Ï·á | ||
| 331 |
Çѱ¹°úÇбâ¼ú¿ø ±³Á÷¿ø ´Üüº¸Çè °¡ÀԿ뿪
|
°ü¸®ÀÚ | 2013-05-14 | 12 | ÀÔÂû¿Ï·á | ||
| 330 |
KAIST °æ¿µÁø´Ü ¿ë¿ª»ç¾÷
|
°ü¸®ÀÚ | 2013-05-14 | 47 | ÀÔÂû¿Ï·á | ||
| 329 |
â¿ø ºÎ¸²½ÃÀå ¿¡³ÊÁö¼º´É Çâ»ó °ø»ç(¿Ü´Ü¿) (±ä±Þ)
|
°ü¸®ÀÚ | 2013-05-02 | 9 | ÀÔÂû¿Ï·á | ||
| 328 |
2012³â ³ì»öÁ¦Ç° ±¸¸Å½ÇÀû ¹× 2013³â ±¸¸ÅÀÌÇà°èȹ °øÇ¥
|
°ü¸®ÀÚ | 2013-04-29 | 61 | ÀÔÂûÁß | ||
| 327 |
Advanced Transmission Electron Microscope and Accessory
|
°ü¸®ÀÚ | 2013-04-23 | 27 | ÀÔÂû¿Ï·á | ||
| 326 |
â¿ø½Ã ³ëÈÄÁÖ°ÅÁö¿ª ³ì»öÅ׸¶°¡·Î Á¶¼º°ø»ç (Åä¸ñ) ±ä±Þ
|
°ü¸®ÀÚ | 2013-04-05 | 11 | ÀÔÂû¿Ï·á | ||
| 325 |
KAIST ½Ã¼³°ü¸®½Ã½ºÅÛ 2Â÷ °³¹ß»ç¾÷(±ä±Þ)
|
°ü¸®ÀÚ | 2013-03-25 | 33 | ÀÔÂû¿Ï·á | ||
| 324 |
Thermal Conductivity Tester (Àç)
|
°ü¸®ÀÚ | 2013-02-20 | 27 | ÀÔÂû¿Ï·á | ||
| 323 |
KAIST °´ç ÁöºØ ±â¿Í ±³Ã¼°ø»ç
|
°ü¸®ÀÚ | 2013-02-19 | 10 | ÀÔÂû¿Ï·á | ||
1 2 3 4 5 6 7 8 9 10 ![]() |
![]() |
|
|






